Parts | Description | Manufacturer | Category |
SN74BCT760DWG4
| IC BUFF/DVR DUAL N-INV 20SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760DWR
| IC BUFF/DVR DUAL N-INV 20SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760DWRE4
| IC BUFF/DVR DUAL N-INV 20SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760DWRG4
| IC BUFF/DVR DUAL N-INV 20SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760MDWREP
| IC BUFF/DVR DUAL N-INV 20SOIC | Texas Instruments (VA) | Integrated Circuits (ICs) |
SN74BCT760MDWREP
| IC BUFF/DVR DUAL N-INV 20SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760MDWREP
| IC BUFF/DVR DUAL N-INV 20SOIC | Texas Instruments (VA) | Integrated Circuits (ICs) |
SN74BCT760N
| IC BUFF/DVR DUAL NON-INV 20DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760NE4
| IC BUFF/DVR DUAL NON-INV 20DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760NSR
| IC BUFF/DVR DUAL NON-INV 20SOP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760NSRE4
| IC BUFF/DVR DUAL NON-INV 20SOP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT760NSRG4
| IC BUFF/DVR DUAL NON-INV 20SOP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ADW
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ADWE4
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ADWG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ADWR
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ADWRE4
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ADWRG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ANT
| IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8240ANTE4
| IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ADW
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ADWE4
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ADWG4
| IC SCAN TEST DEVICE BUFF 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ADWR
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ADWRE4
| IC SCAN TEST DEVICE BUFF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ADWRG4
| IC SCAN TEST DEVICE BUFF 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ANT
| IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8244ANTE4
| IC SCAN TEST DEVICE BUFF 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ADW
| IC SCAN TEST DEVICE TXRX 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ADWE4
| IC SCAN TEST DEVICE TXRX 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ADWG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ADWR
| IC SCAN TEST DEVICE TXRX 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ADWRE4
| IC SCAN TEST DEVICE TXRX 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ADWRG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ANT
| IC SCAN TEST DEVICE TXRX 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8245ANTE4
| IC SCAN TEST DEVICE TXRX 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ADW
| IC SCAN TEST DEVICE LATCH 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ADWE4
| IC SCAN TEST DEVICE LATCH 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ADWG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ADWR
| IC SCAN TEST DEVICE LATCH 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ADWRE4
| IC SCAN TEST DEVICE LATCH 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ADWRG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ANT
| IC SCAN TEST DEVICE LATCH 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8373ANTE4
| IC SCAN TEST DEVICE LATCH 24-DIP | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8374ADW
| IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8374ADWE4
| IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8374ADWG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8374ADWR
| IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8374ADWRE4
| IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | Integrated Circuits (ICs) |
SN74BCT8374ADWRG4
| IC SCAN TEST DEVICE 24SOIC | Texas Instruments | Integrated Circuits (ICs) |